Grand’s self-innovated equipments showed in Shanghai Semicon 2015-03-17
Grand’s self-innovated equipments showed in Shanghai Semicon

17-19 March 2014, The 25th International Semiconductor Exhibition “SEMICON China 2015” was held at Shanghai New International Expo Center. Our latest R&D exhibiting products received a good reputation.

Grand  Equipment Product Manager Mr.Liu Fei (second from right) introduce exhibit product to the foreign participants

This is our 8th consecutive SEMICON exhibition we took part.  Exhibiting two equipments, we got the industry approval. Grand brand popularity in the semiconductor industry is increasing.
Our Exhibiting equipments that people flocked to visit are GIS126 automatic optical inspection machine and GIT120 IC chip test machine. These 2 equipments are popular in semicon business industry.
GIS126 is our own developed innovative product, which use high-visual defect detection system, UPH range is 20K-120K,passing rate of 99.95%. It has automatic visual optical detection for chip location, gold wire bonding, and surface defect of winding products.
GIT120 IC TESTER is a high-end equipment that developed by Grand and world’s biggest IC TESTER equipment supplier in USA. It not only meets the requirements that customer can sorted by grades per the results of the test, but also compatible with various high-tec chips, such as QFP、QFN、BGA、SIP、 etc. It has features for high-speed and stability. GTI120 has great market potential and customer needs as well as competitive alternative advantages of the high price of similar foreign products.
Mr. Xiaotian Xu, Vice President of China Semiconductor Industry Association came to our booth for guidance, and wish Grand can innovate independently for greater prosperity.  

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